Allows tilt series acquisition to generate 3D images.Ĭryo-tomography and cryo transfer: Gatan 914 & Gatan Elsa Cryo-tomography holders including cold controller/ cryo-workstation.Įlectrical holder. Room Temperature Tomograpghy: Gatan 916 Room temp tomography holder with up to 80 degrees tilt. Oxford Instruments 80mm X-Max system for energy dispersive x-ray spectroscopy (EDS) analysis. Enables elemental mapping via Electron Energy Loss Spectroscopy (EELS) and Energy Filtered TEM (EFTEM). Gatan Tridiem Filter Spectrometer and 2K x 2K CCD camera, configured for use at 100kV and 200kV. Capable of 150 frames per second at full view, or >3500fps at 256x256 pixels. This is a 23.6 megapixel, electron counting direct detection (DDE) camera. High Angle Annular Dark Field (HAADF) STEM Detector. This information can be used to infer elemental composition, chemical bonding, valence and conduction band electronic properties.įield emission electron gun (FEG) instrument, providing a high brightness and high stability electron source for use at 100kV and 200kV.Ī point resolution of 0.19nm allows the ultrahigh resolution analysis of materials, on the nanometer scale. It is also possible to measure the loss of energy from the inelastic scattering of electrons in specimen transmission (EELS). As the resulting X-ray energies are characteristic of the atomic structure of the element they originated from, the spectra generated can be used to identify the constituent elements. X-ray emission consequent to the interaction of the primary electron beam with the sample, can also be detected by an energy-dispersive spectrometer (EDS) within the TEM. The diffraction patterns can then be used to analyse to the crystal structure of the specimen. Positive interference in the back focal plane leads to discreet spots of electron localisation, which can then be visualised by mapping the back focal plane to the imaging apparatus. The crystal structure of samples with regular atomic structure (crystalline material) may also be analysed via electron diffraction. By rotating a sample, and taking multiple images at each rotation, it is also possible to build a 3D representation of the specimen (tomography). The intensity of un-scattered electrons gives rise to a "shadow image" of the specimen, with different parts of a specimen displayed in varied darkness according to density. Traditional bright field imaging relies on incident electrons being scattered and disappearing from the beam depending upon the compositional density and crystal orientation of the sample. The electrons passing through the specimen then impact on a detector. Electromagnetic lenses are used to focus the electrons into a very thin beam and this is then directed through the specimen of interest. An electron source at the top of the microscope emits electrons that travel through a vacuum in the column of the microscope.
0 Comments
Leave a Reply. |
AuthorWrite something about yourself. No need to be fancy, just an overview. ArchivesCategories |